For complicated scientific R&D tasks, there is a necessity to manage precise tools that are capable of offering supreme assistance to the scientists and researchers. This is where Scanning Probe Microscopes covers the technique of both Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM). Functionality of STM & AFM It is important to know that, STM microscopes follow a process where electrons tunnel through whatever barrier is available when voltage is introduced to the tip which is situated just above the surface. Hence, atomic resolution happens when the tunneling falls at a certain distance from the surface resulting in just the final few layers of the tip contributing. On the other hand, under AFM the sharper tips manage to scan across the surface and eventually measure the structure of the sample. Usefulness of Scanning Probe Microscope With the availability of Scanning Probe Microscope , you are rewarded with the option to analyz...